Refereed Articles
Resonant X-ray Microdiffraction Imaging of Polarization Switching in Ferroelectric SrBi2Ta2O9
  The spatial distribution of polarization switching in a strontium bismuth tantalate (SrBi2Ta2O9) thin film capacitor has been imaged at submicron length scales using synchrotron x-ray microdiffraction. Imaging of the ferroelectric polarization in operating devices with previous techniques has been frustrated by factors (such as the presence of a metallic top electrode) which do not hinder these x-ray diffraction measurements. The intensity of surface normal x-ray reflections of the SrBi2Ta2O9 film depended on the local ferroelectric polarization and changed by as much as 20absorption edge enhanced this contrast. The extent of the switched area observed microscopically agrees with estimates deduced from polarization-electric field hysteresis loops.  
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|Formatted Citation|

 
  Resonant X-ray Microdiffraction Imaging of Polarization Switching in Ferroelectric SrBi2Ta2O9. P. Evans, E. Isaacs, G. Kowach, E. Dufresne, A. Pignolet, H. Lee, in preparation.